Study with the several resources on Docsity
Earn points by helping other students or get them with a premium plan
Prepare for your exams
Study with the several resources on Docsity
Earn points to download
Earn points by helping other students or get them with a premium plan
The solutions to the first part of the midterm exam for the eecs-130 integrated circuit devices course, which covers the principles and applications of integrated circuit devices. The exam questions cover topics such as forward biasing, recombination, temperature effects on current, and diode characteristics.
Typology: Exams
1 / 2
This page cannot be seen from the preview
Don't miss anything!
Midterm Exam #2, part one Solutions
(35% total point weighting)
March 14, 1996
a.
b.
The current supplied by forward biasing the pn is that needed to replenish minority charge being lost due to recombination.
c.
Current increases as temperature increases
d.
a.
b.
c.
i.
ii.
iii.
iv.
d.
e.
