Introduction-Atomic Force Microscopy-Lecture Slides, Slides of Quantum Physics

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To Perform Surface

Characterization Using Atomic

Force Microscope (AFM)

Surface Characterization

To describe the interested features

present on the surface.

AFM can used to study

 Surface Topography  Surface Magnetic Features  Surface Electric Features  STM (Scanning Tunneling Microscopy)  Lithography

Atomic Force Microscope G. Binnig, C. F. Quate and Gerber; Phys. Rev. Lett. 56, 930–933 (1986)

Principle

Types of modes

Contact mode (^) Tapping mode

Equipment

Three main components

 Vibration Isolator (It houses the main machine includes scanner, probe head etc.)

 EIU (Electronic Interface Unit)

 Computer integrated with EIU and equipped with software.

Equipment

 Vibration Isolation

 For better imaging the vibrations are to be controlled like sound, surface and electromagnetic vibrations.

 A housing is used for this purpose.

Housing of AFM for Vibration Dampingdocsity.com

Equipment

AFM BASE SCANNER docsity.com

Tips Used in AFM

Cut Tungsten STM tip Manufactured by VEECO

New HI’RES tip used for fine details Manufactured by Mikro Maschdocsity.com

AFM Resoultion

Concept of resolution is different from

optical microscope as it is 3D imaging.

The resolution of AFM depends on

sharpness of tip and surface features.

Modes of Operation

AFM Images

 Surface Topography.

AFM Images

MFM Image

Magnetic Force Microscopy (MFM) image of hard disk, 20μm scan docsity.com

AFM Images

 STM Image of Si(111) plane showing defects