Reference Sheet - Semiconductor Devices - Lecture Notes | ECE 30500, Study notes of Physics of semiconductor devices

ECE305 Reference Sheet Material Type: Notes; Professor: Melloch; Class: Semiconductor Devices; Subject: ECE-Electrical & Computer Engr; University: Purdue University - Main Campus; Term: Spring 2010;

Typology: Study notes

Pre 2010

Uploaded on 12/13/2010

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ECE305 Reference Sheet
Yangorang
Constants
q=1.6 ×10
19
C(charge electron)
m0=9.11×1031 Kg(mass electron)
ε
0
=8.85 ×10
14
F
cm
(permittivity free space)
k=8.617 ×10
5
eV
K
(Boltzmann)
h=6.63 ×1034 J s
(Planck)
h=h
2π=1.0552×10
34
kT =0.0259 eV
(
Thermal energy at T =300 K
)
kT
q=0.0259V(Thermal voltage at T =300 K)
(for silicon at 300K)
Miller Indices
1. Note intercepts of desired plane with coordinate
axes
2. Divide each intercept by unit cell length
3. Take reciprocals of values
4. Use appropriate multiplier to convert to smallest
possible set of whole numbers
5. Enclose in ( … )
Bohr Model
E
H
=m
0
q
4
2
(
4π ε
0
h n
)
2
=13.6
n
2
eV
; n = 1, 2, 3…
EH
is electron binding energy within hydrogen atom
E=h ω
;
ω=2πf
;
c=
;
p=h
λ
n = number electrons / cm3
p = number holes / cm3
n=p=ni
in intrinsic semiconductor under equilibrium
(assuming room temperature)
n
i
=2×10
6
/cm
3
(in GaAs)
ni=1×1010 /cm3
(in Si)
n
i
=2×10
13
/cm
3
(in Ge)
Donors (electron-increasing): P, As, Sb
Acceptors (hole-increasing): B, Ga, In, Al
Density of States (at energy level E)
gc
(
E
)
=mn
¿
2mn
¿(EEc)
π2h3
,
E E
C
g
v
(
E
)
=m
p
¿
2m
p
¿
(E
v
E)
π
2
h
3
,
E E v
Fermi Function
f
(
E
)
=1
1+e(EEF)/kT
where
EF
is the Fermi energy or level
Probably that state is not filled at given energy E is
1f
(
E
)
Intrinsic Fermi level is slightly above the middle of the
bandgap if effective hole mass is greater than the effective
electron mass.
Equilibrium Carrier Concentrations
NC=2
[
mn
¿kT
2π h2
]
3/2
N
V
=2
[
m
p
¿
kT
2π h
2
]
3/2
pf3

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Yangorang Constants q=1.6 × 10 − 19 C (charge electron) m 0 =9.11× 10 − 31 Kg(mass electron) ε 0 =8.85 × 10

− 14 F

cm (permittivity free space) k =8.617 × 10 − 5 eV K (Boltzmann) h=6.63 × 10 − 34 J ∙ s (Planck) h= h 2 π

=1.0552× 10

34 kT =0.0259 eV (Thermal energy at T = 300 K ) kT q =0.0259V (Thermal voltage at T = 300 K ) ni = 10 10 / cm 3 (for silicon at 300K) Miller Indices

  1. Note intercepts of desired plane with coordinate axes
  2. Divide each intercept by unit cell length
  3. Take reciprocals of values
  4. Use appropriate multiplier to convert to smallest possible set of whole numbers
  5. Enclose in ( … ) Bohr Model EH = −m 0 q 4

2 ( 4 π ε 0 h n)

n 2 eV^ ; n = 1, 2, 3… EH is electron binding energy within hydrogen atom E=h ω ; ω= 2 πf ; c=fλ ; p=^ h λ n = number electrons / cm^3 p = number holes / cm^3 n=p=ni in intrinsic semiconductor under equilibrium (assuming room temperature) ni = 2 × 10 6 /cm (^3) (in GaAs) ni = 1 × 10 10 /cm 3 (in Si) ni = 2 × 10 13 /cm (^3) (in Ge) Donors (electron-increasing): P, As, Sb Acceptors (hole-increasing): B, Ga, In, Al Density of States (at energy level E) gc ( E)= mn ¿ √^2 mn ¿ (E−Ec) π 2 h

3 ,^ E^ ≥^ EC

gv ( E)= mp ¿ √^2 mp ¿ ( Ev−E) π 2 h 3 ,^ E^ ≤^ Ev Fermi Function f ( E )=

1 + e (E −E (^) F)/ kT where^ EFis the Fermi energy or level Probably that state is not filled at given energy E is 1 −f ( E) Intrinsic Fermi level is slightly above the middle of the bandgap if effective hole mass is greater than the effective electron mass. Equilibrium Carrier Concentrations NC= 2 [ mn ¿ kT 2 π h (^2) ] 3 / 2 NV = 2 [ mp ¿ kT 2 π h (^2) ] 3 / 2

Yangorang n=NC e (E (^) F−EC )/ kT p=N (^) V e (EV −E (^) F )/kT n=ni e (E (^) F−Ei)/ kT p=ni e (Ei−E (^) F)/kT Where Ei is the Fermi level for an intrinsic semiconductor. np=ni 2 p−n+ND−N (^) A = 0 n=

N D −N A

[(^

N D−N A

+ni 2

]

p=

N A −N D

[(^

N A −ND

+ni 2

]

Ei =

EC + EV

kTln

mp ¿ mn

Carrier Action vd=drift velocity vdsat ≈ 10 7 cm s for Si at 300K J (^) p∨drift =drift current density=

I

A

=qp vd (holes) J (^) p∨drift =q μp pε I=J × A=qp v (^) d A μn∧μ (^) p=electron mobilities (^) (at room temp in fig.) ρ=resistivity ; σ =conductivity ε =ρ ∙ J ; J=σ ∙ ε ρ=

q ( μn n+ μ p p )

ε =

q d Ec dx

q d Ev dx J (^) P=J (^) P∨drift + J (^) P∨diff =q μp pε −q DP p J (^) N=J (^) N ∨drift + J (^) N ∨diff =q μp nε +q DN n Einstein Relationship: DN μn

kT q ;

DP

μp

kT q Photogeneration I =I 0 e −αxx I 0 =¿ (^) light intensity just inside material αx =¿material dependent absorption coefficient ∂ n

∂ t |light

=GL ( x , λ) =GL 0 ( x , λ) e −ax GL is photogeneration rate (cm-3^ sec) R-G Analysis Parameters n 0 , p 0 =¿ carrier concentrations under equilibrium n , p=¿ carrier concentrations under arbitrary conditions ∆ n=n−n 0 , ∆ p= p−p 0 : deviations in carrier concentrations from equilibrium values NT =¿ (^) number of R-G centers/cm^3 Low Level Injection Conditions ∆ p n 0 , n n 0 for n-type material ∆ n p 0 , p p 0 for p-type material