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ECE305 Reference Sheet Material Type: Notes; Professor: Melloch; Class: Semiconductor Devices; Subject: ECE-Electrical & Computer Engr; University: Purdue University - Main Campus; Term: Spring 2010;
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Yangorang Constants q=1.6 × 10 − 19 C (charge electron) m 0 =9.11× 10 − 31 Kg(mass electron) ε 0 =8.85 × 10
cm (permittivity free space) k =8.617 × 10 − 5 eV K (Boltzmann) h=6.63 × 10 − 34 J ∙ s (Planck) h= h 2 π
34 kT =0.0259 eV (Thermal energy at T = 300 K ) kT q =0.0259V (Thermal voltage at T = 300 K ) ni = 10 10 / cm 3 (for silicon at 300K) Miller Indices
n 2 eV^ ; n = 1, 2, 3… EH is electron binding energy within hydrogen atom E=h ω ; ω= 2 πf ; c=fλ ; p=^ h λ n = number electrons / cm^3 p = number holes / cm^3 n=p=ni in intrinsic semiconductor under equilibrium (assuming room temperature) ni = 2 × 10 6 /cm (^3) (in GaAs) ni = 1 × 10 10 /cm 3 (in Si) ni = 2 × 10 13 /cm (^3) (in Ge) Donors (electron-increasing): P, As, Sb Acceptors (hole-increasing): B, Ga, In, Al Density of States (at energy level E) gc ( E)= mn ¿ √^2 mn ¿ (E−Ec) π 2 h
gv ( E)= mp ¿ √^2 mp ¿ ( Ev−E) π 2 h 3 ,^ E^ ≤^ Ev Fermi Function f ( E )=
1 + e (E −E (^) F)/ kT where^ EFis the Fermi energy or level Probably that state is not filled at given energy E is 1 −f ( E) Intrinsic Fermi level is slightly above the middle of the bandgap if effective hole mass is greater than the effective electron mass. Equilibrium Carrier Concentrations NC= 2 [ mn ¿ kT 2 π h (^2) ] 3 / 2 NV = 2 [ mp ¿ kT 2 π h (^2) ] 3 / 2
Yangorang n=NC e (E (^) F−EC )/ kT p=N (^) V e (EV −E (^) F )/kT n=ni e (E (^) F−Ei)/ kT p=ni e (Ei−E (^) F)/kT Where Ei is the Fermi level for an intrinsic semiconductor. np=ni 2 p−n+ND−N (^) A = 0 n=
+ni 2
p=
+ni 2
Ei =
kTln
mp ¿ mn
Carrier Action vd=drift velocity vdsat ≈ 10 7 cm s for Si at 300K J (^) p∨drift =drift current density=
=qp vd (holes) J (^) p∨drift =q μp pε I=J × A=qp v (^) d A μn∧μ (^) p=electron mobilities (^) (at room temp in fig.) ρ=resistivity ; σ =conductivity ε =ρ ∙ J ; J=σ ∙ ε ρ=
ε =
q d Ec dx
q d Ev dx J (^) P=J (^) P∨drift + J (^) P∨diff =q μp pε −q DP ∇ p J (^) N=J (^) N ∨drift + J (^) N ∨diff =q μp nε +q DN ∇ n Einstein Relationship: DN μn
kT q ;
μp
kT q Photogeneration I =I 0 e −αxx I 0 =¿ (^) light intensity just inside material αx =¿material dependent absorption coefficient ∂ n
=GL ( x , λ) =GL 0 ( x , λ) e −ax GL is photogeneration rate (cm-3^ sec) R-G Analysis Parameters n 0 , p 0 =¿ carrier concentrations under equilibrium n , p=¿ carrier concentrations under arbitrary conditions ∆ n=n−n 0 , ∆ p= p−p 0 : deviations in carrier concentrations from equilibrium values NT =¿ (^) number of R-G centers/cm^3 Low Level Injection Conditions ∆ p ≪ n 0 , n ≅ n 0 for n-type material ∆ n ≪ p 0 , p ≅ p 0 for p-type material