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Material Type: Project; Class: ENGINEERING DESIGN PROJECT; Subject: Electrical & Computer Engineer; University: Oregon State University; Term: Fall 2006;
Typology: Study Guides, Projects, Research
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Sponsored by Boeing Mentors: Tony Amort, Morris Adams
OSU Senior Design Group 10: Ming-Hung Kuo Luke Lai Stephen Le Wei Zhen http://classes.engr.oregonstate.edu/eecs/fall2006/ece441/groups/g10/index.htm
Revision History
Rev. 0.0 10/18/06 Initial Release Rev. 0.1 10/19/06 Revised and added content Rev. 1.0 11/01/06 Added Preliminary Design Specification Guidelines
2. Introduction:
The controller based IC tester is a fixture built for Boeing to be used in their Solid State Electronics Development organization. The device will be used in a chamber with device under test (DUT) to verify functionality under various conditions. When testing for radiation effects, the device will be placed outside the testing chamber and will connect to the DUT via a cable. The DUT will be connected via a zero insertion force (ZIF) socket. The device will then communicate with a PC through a serial bus. Standard IC test equipment, such as this, exists but is too large to fit inside small test chamber used to test single event effects. Deliverables for this project are the software and hardware needed to test various digital and analog IC’s. A previous version of the controller based IC tester was developed last year which tested digital functionality. This will provide a starting point for updating the hardware to meet the design requirements.
2.1 Customer Requirements & Product Background:
Origin of the Need for the Product:
The need for this product originated as soon as ICs where developed. It is expected to have an IC test fixture for any IC. The IC test fixture is used by semiconductor firms. These companies make ICs and will need to have a means of testing them when completed. This is where IC test fixtures come in to place. Companies like GDI and BK precision are a couple of companies who specializes in IC test fixtures. Functionality of an IC test fixture can vary from very simple operations to complex. And, the size of the IC test fixture may be depended on their functionality. A small compact IC test fixture may have very general usage and user friendly while large IC test fixtures have very specific and custom functionality. Any company that is involved in the semiconductor IC industry will have a need for IC test fixture. Semiconductor companies who make products for the everyday consumer will need to test every component in their product. These companies usually have a test engineering group that ensures the functionality of the end product.
Customer and the Need:
The Boeing Solid State Electronics Development organization tests prototype IC’s under various conditions. These conditions may vary from thermal to radiation testing inside a chamber. Boeing’s standardized IC test equipment is too big to fit inside the chambers. Our goal is to build a test fixture able to fit inside the test chamber and be able to verify and test for functionality. Our sponsor, Boeing, is our primary customer and we expect the quantity for this project will be few, probably one.
Applications:
This project will be very specific. It will be only used by Boeing and will be able to test a specific list of IC’s. Moreover, this test fixture will be limited to IC’s with 40 pin or less. IC’s we are required to accommodate are: 7400 series logic gate counters (74163 for example). Successive approximation 8 bit (or larger) A to D (ADC0803LCN for example) 32K x 8 (or larger) Static RAM (62256LP-12 for example) PWM Motor controller (TC648VPA for example)
And if time and resources allow, test the various features of a Microcontroller (PIC or AVR for example)
The fixture will be used inside a test chamber. And in some cases it will be tested in radiation. In radiation, we will need to have our fixture placed outside the test chamber, to prevent any radiation damage to the fixture, and allow cables to travel inside the test chamber. Also, Boeing requires us to have a test fixture with dimension 12x12 inch.
Product Tradeoffs and the Market:
The product will be specific thus can’t really be compared to similar products on the market. Our product will be custom built; this is where it has its value. There aren’t many companies similar to our product. Since the market is limited IC test fixtures cost around $1000+. Ours will be low cost, less than $1000, and fit Boeings requirements, while other products may or may not fit the bill.
DUT Consideration Product dimetion
Op Amp, Comparaor, Multiplexer 7.87" x 3.94" x 2.17" Voltage Regulator, Transistor Array Voltage Reference, Analog Switch Optoisolators/Optocouplers, DACS ADSC, Special Funtions ICs, Virtual Ground, Audio ICs
Series 54/74 TTL ICs, CMOS ICs, 7.87" x 3.94" x 2.17" Memory ICs, Interface, Peripheral, Micorcontroller & LSI ICs
Zener Diode, Photo Coupler, Driver 13" x 4" x 12" Communication IC, Swithinc Power Supple IC, Op Amp, Comparator Regulator
Most of the 74XX, 4XXX, RAM, Programmable handheld Professional select CPU's
Component Name
ChipMaster Compact
ICT-7A
BK
BK
2.2.1 Product Space Analysis
The IC tester is a small market, not many companies produce this product. The analog and digital functions are never in one device. Also, the DUT socket is normally ZIF socket because it is compatible with a wide range of ICs.
BK Precision Corp. – BK The BK570 is a handheld device that cost about $1000. It is able to perform either digital IC testing or analog IC testing. Both the analog and the digital IC tester use ZIF socket and both tests on a wide range of DUTs. One down side about this is that it has no computer interface.
Electronix Express – ICT-7A The ICT-7A is a stationary IC tester. It uses 24pin IC socket and it only tests analog ICs. The downside of this device is that it is 13” x 4” x 12” making it hard to move around. Also, the ICT-7A has a smaller range of DUTs.
ABI Electronics Limited – LinearMaster & ChipMaster Compact Professional. The LinearMaster and ChipMaster is a handheld device that has the same wide range of DUT and ZIF socket as the BK Precision’s IC tester. The strength of this device is the ability to interface with computer, making it programmable in testing ICs.
RSR Electronics – LP- The LP-2 only has an analog IC tester with a 16pin ZIF socket. There is also a handheld device that uses one 9v battery. This IC tester has a short range of DUTs, but the strength of this device is it only has $584, about half of what the others cost.
2.2.2 Target Feature Set
The IC tester includes the following features:
Our product is named the Retargetable ASIC Tester. Application Specific Integrated Circuit (ASIC) is a specialized microchip tailored to a particular application. Adopted from last year’s project, we are continuing to update the project. The term ‘retargetable’ used here means it can be reconfigured to support an almost limitless variety of devices. In fact, the tester is perfectly suitable for testing standard production ICs as well as custom ASICs.
Analog and Digital IC tester The test fixture is able to test both analog and digital IC’s. Both analog and digital systems will have input and output lines. In analog, input will be controlled by the Analog to Digital Converter (ADC) on our microcontroller IC. Output will have to be handed by a Digital to Analog Converter (DAC) IC.
PC interface
4 Top Level Description
This is a high level view of the product primarily as the world interfaces to it. It also is the top-most level view of the products constituent parts. An actual physical drawing of the product may be appropriate here depending on the product.
High level view of the product:
Figure 1
Figure above is a high level view of the product. The very basic representation of our IC tester shows how user interfaces with IC tester. Two external devices which are important to the fixture’s operation are the 12v bench power supply and the PC. These two are a must for it is important to power the IC tester and get information out to the user. Inside the IC tester is controller, support circuitry, ZIF socket, and Ribbon connector. Both the ZIF socket and ribbon connector provide the means for the DUT to connect to the IC tester. The controller and support circuitry represent the Top Level Interface Definition made clear later in document.
4.1 Top Level Block Diagram
Shown in Fig. 2 is the entire System visualized as a collection of interconnected modules. The system comprises all elements below the dashed horizontal line. Features of the outside world with which it interacts are found above the dashed line. Four avenues of interaction cross this dividing line. Two are power supply
connections, and one is the RS-232 serial interface through which the System communicates in normal operation. As suggested by their larger size and numerous connections, the microcontroller and the plugboard are the core components of this System. The microcontroller performs all system control and computation functions. The plugboard is responsible for correctly routing output and input lines from the System to the appropriate pins on the DUT socket. The plugboard is specialized to correctly connect a specific chip or family of chips with similar pin out. Between the microcontroller and the plugboard socket are four data conversion modules. The digital input and output modules transfer digital signals between the microcontroller and the DUT, via the plugboard, providing voltage translation between the multiple DUT voltage domains and the constant 5v logic level used by the microcontroller. These modules also provide a serial-parallel conversion that allows the microcontroller to operate 16 input and 16 output channels without sacrificing valuable port pins. Main system power is a 5v bus provided by the main system supply module, regulated from a 12vdc input. The DUT may be powered either by an external bench supply, routed through the DUT supply module, or from any of three reference voltages available at the plugboard. The DUT supply module is a compromise between an external supply, specified in the project requirements, and our interest in protecting our hardware from power sources not under our design control.
Figure 2
4.1.2 Environment
The IC tester will be operated inside a controlled environmental test chamber for the ICs. We need to design the IC tester to withstand the IC test camber. The minimum temperature requirements for the IC tester are to be operated between -30°C to 80° C, and it needs to withstand humidity of 0% RH to 50% RH inside the test chamber. For storage, this device needs to be kept in -65°C to 150°C with humidity between 0% RH and 70%RH. Since device is not protected from Electro Static Discharge (ESD), ESD safe garments will be required to handle IC tester board.
References:
www.elexp.com/tst_7000.htm www.abielectronics.uk www.tequipment.net www.capetronics.com http://www.boeing.com/
Naming Conventions:
DUT – device under test ZIF – zero insertion force PWM – pulse width modulation Boeing – part of the International Space Station (ISS), build commercial airplanes, part of defense systems, Integrated Defense Systems (IDS), one of the largest export companies in US. ASIC – Application Specific Integrated Circuit
