Exploring Error Detection in Applications: DAIKON and CVR Techniques - Prof. Zbigniew T. K, Assignments of Electrical and Electronics Engineering

ECE 542/CS 536 - Homework 4

In this homework, you will explore application-based error detectors. You will

explore two techniques for deriving assertions: (i) DAIKON [1], a dynamic analysis

technique, which derives application invariants based on runtime information; (ii) CVR

[2], a static analysis technique, that extracts the backward slice of a critical variable to

(I) you will assess a quick sort application with pre-derived assertions and inject

specific faults using GDB to corrupt variables that are checked by the

assertions. This will help you get familiar with fault injection experiments;

(II) you will derive new assertions, using DAIKON and CVR techniques, and

compare both using a fault injector that corrupts an arbitrary data value in

memory. This will help you learn how the assertions are derived and assess their

detection capabilities under random data errors.

Part I

function.

•

Quicksort-Cvr.c

Quicksort function

contains both checks and also path tracking code.

After understanding the application and the derived checks, you can inject faults

into the protected variables (and their backward slices). Your task is to inject a single

bit-flip fault per run into the protected variables, for both Quicksort-Cvr.c and Quicksort-

Daikon.c. You should have at least 15 runs per program and compare the injection

outcome as it follows:

a) number of injections,