Exam 2 Study Guide - Electrical Circuits | EE 261, Exams of Microelectronic Circuits

Material Type: Exam; Professor: Inan; Class: Electrical Circuits; Subject: Electrical Engineering; University: University of Portland; Term: Fall 2003;

Typology: Exams

Pre 2010

Uploaded on 08/18/2009

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- p. 1 of 1 - ee261-fall2003-sg#2.doc
EE261 Test 2 Study Guide Fall 2003
Goals for Test 2:
1. Given any circuit containing resistors, independent sources, and/or dependent sources,
you should be able to find the following:
- the voltage at any node
- the voltage across any element
- the current through any element
- the power absorbed (or delivered) by any element
- the energy absorbed (or delivered) by any element
- the voltage or current due to each independent source acting alone (superposition)
- the Thevenin and Norton equivalent circuits
- find the resistance that leads to the maximum power transfer
2. You should know how to combine series and parallel resistors, inductors, and
capacitors.
3. Given any circuit containing sources, resistors, inductors, capacitors, and switches, you
should be able to find the initial and final voltages and currents.
4. Be able to determine the energy stored in an inductor and capacitor.
Topics for Test 2:
The topics we have covered that help achieve these goals are as follows:
All topics listed in Test 1 Study Guide
Node Voltage Analysis
Superposition
Source Transformation
Thevenin's Equivalent Circuit Norton's Equivalent Circuit
Maximum Power Transfer Theorem
Combine Series and Parallel Inductors Combine Series and Parallel Capacitors
Inductor Voltage/Current Relationships Capacitor Voltage/Current Relationships
Recommended Study Method for Test 2:
1. Review topics on Test 1, and Hw 4, 5, and 6.
2. Read Sections 4-1 though 4-5, and Chapters 5 and 7.
3. Prepare a crib sheet with all the information you think will be useful during the test.
4. Using only your crib sheet and calculator, solve as many problems you can and then
compare your answer to the solution. There are examples that we worked in class,
examples in the textbook, homework problems, problems in the book with the answer,
and last year's test.

Partial preview of the text

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  • p. 1 of 1 - ee261-fall2003-sg#2.doc

EE261 Test 2 Study Guide Fall 2003

Goals for Test 2:

  1. Given any circuit containing resistors, independent sources, and/or dependent sources, you should be able to find the following:
  • the voltage at any node
  • the voltage across any element
  • the current through any element
  • the power absorbed (or delivered) by any element
  • the energy absorbed (or delivered) by any element
  • the voltage or current due to each independent source acting alone (superposition)
  • the Thevenin and Norton equivalent circuits
  • find the resistance that leads to the maximum power transfer
  1. You should know how to combine series and parallel resistors, inductors, and capacitors.
  2. Given any circuit containing sources, resistors, inductors, capacitors, and switches, you should be able to find the initial and final voltages and currents.
  3. Be able to determine the energy stored in an inductor and capacitor.

Topics for Test 2:

The topics we have covered that help achieve these goals are as follows:

All topics listed in Test 1 Study Guide Node Voltage Analysis Superposition Source Transformation Thevenin's Equivalent Circuit Norton's Equivalent Circuit Maximum Power Transfer Theorem Combine Series and Parallel Inductors Combine Series and Parallel Capacitors Inductor Voltage/Current Relationships Capacitor Voltage/Current Relationships

Recommended Study Method for Test 2:

  1. Review topics on Test 1, and Hw 4, 5, and 6.
  2. Read Sections 4-1 though 4-5, and Chapters 5 and 7.
  3. Prepare a crib sheet with all the information you think will be useful during the test.
  4. Using only your crib sheet and calculator, solve as many problems you can and then compare your answer to the solution. There are examples that we worked in class, examples in the textbook, homework problems, problems in the book with the answer, and last year's test.