extra question no semiconductor, Exercises of Physics of semiconductor devices

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Problem Set # 3 Solution
ECEN 3320 Fall 2013
Semiconductor Devices
September 9, 2013 โ€“ Due September 18, 2013
1. A semiconductor has Eg= 1.40 eV and mโˆ—
h= 0.5m0; mโˆ—
e= 0.1m0at T= 300โ—ฆK.
(a) Calculate the position of the intrinsic Fermi level, Ef, with respect to the middle of the
band gap, Eiโˆ’Emidgap =Eiโˆ’Eg/2.
Solution: The intrinsic Fermi level is defined in terms of the bandgap, temperature and
effective carried masses as
Eiโˆ’Ecโˆ’Ev
2=3
4kT ln ๎˜’mโˆ—
h
mโˆ—
e๎˜“.
Using the given values, we find that the distance of the Fermi level from the center
of the gap is
Eiโˆ’Ecโˆ’Ev
2=3
40.0258 ln(5) = 0.750.02581.61 โ‰ˆ0.0313eV
(b) Calculate the intrinsic carrier concentration, ni.
Solution: The intrinsic carrier concentration in terms of the effective densities of states,
Ncand Nvand the bandgap energy as
ni=pNcNvexp [โˆ’Eg/kT ].
Recalling that the effecive densities of states are given by
Nc= 2 ๎˜’mโˆ—
ekT
2ฯ€ยฏh2๎˜“3/2
Nv= 2 ๎˜’mโˆ—
hkT
2ฯ€ยฏh2๎˜“3/2
we find that for a bare electron
N0= 2 ๎˜’m0kT
2ฯ€ยฏh2๎˜“3/2
= 2.61 ร—1019 cmโˆ’3.
Using the above, we find that
niโ‰ˆ(0.05)3/22.61 ร—1019 ร—exp(โˆ’0.70/0.0258) โ‰ˆ4.8ร—106cmโˆ’3.
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Problem Set # 3 Solution

ECEN 3320 Fall 2013

Semiconductor Devices

September 9, 2013 โ€“ Due September 18, 2013

  1. A semiconductor has Eg = 1.40 eV and mโˆ— h = 0. 5 m 0 ; mโˆ— e = 0.1m 0 at T = 300โ—ฆK.

(a) Calculate the position of the intrinsic Fermi level, Ef , with respect to the middle of the band gap, Ei โˆ’ Emidgap = Ei โˆ’ Eg/2. Solution: The intrinsic Fermi level is defined in terms of the bandgap, temperature and effective carried masses as

Ei โˆ’ Ec โˆ’ Ev 2

kT ln

( mโˆ— h mโˆ— e

) .

Using the given values, we find that the distance of the Fermi level from the center of the gap is

Ei โˆ’ Ec โˆ’ Ev 2

0 .0258 ln(5) = 0. 750. 02581. 61 โ‰ˆ 0 .0313eV

(b) Calculate the intrinsic carrier concentration, ni. Solution: The intrinsic carrier concentration in terms of the effective densities of states, Nc and Nv and the bandgap energy as

ni =

โˆš NcNv exp [โˆ’Eg/kT ].

Recalling that the effecive densities of states are given by

Nc = 2

( mโˆ— ekT 2 ฯ€ยฏh^2

) 3 / 2

Nv = 2

( mโˆ— hkT 2 ฯ€ยฏh^2

) 3 / 2

we find that for a bare electron

N 0 = 2

( m 0 kT 2 ฯ€ยฏh^2

) 3 / 2 = 2. 61 ร— 1019 cmโˆ’^3.

Using the above, we find that

ni โ‰ˆ (0.05)^3 /^2 2. 61 ร— 1019 ร— exp(โˆ’ 0. 70 / 0 .0258) โ‰ˆ 4. 8 ร— 106 cmโˆ’^3.

(c) Impurity atoms are added so that the Fermi level, Ef , is 0.35 eV above the middle of the band gap. i. Are the impurities donors or acceptors? Solution: The impurities are donors as donors raise the Fermi level. The intrinsic Fermi level is raised by only 0.03 eV relative to the center of gap. The โ€™measuredโ€™ 0.35 eV is much larger than this indicating the semiconductor is an extrinsic n- doped semiconductor. ii. What was the concentration of impurities added? Solution: We need to make an additional assumption here, the assumption that the donor impurities are shallow. It is only the shallow impurities (within a few kT of the band edge) that will contribute to the repositioning of the Fermi level relative to the intrinsic Fermi level.

ND = n 0 = ni exp

[ Ef โˆ’ Ei kT

]

that evaluates to

ND โ‰ˆ 1. 07 ร— 1012 cmโˆ’^3.

  1. Determine the equilibrium electron and hole concentrations in silicon for the following con- ditions.

Solution: Using the fact that there is no free charge density in an equilibrium material, we can write that

n 0 โˆ’ p 0 + N (^) aโˆ’ โˆ’ N (^) d+ = 0.

The law of mass action n 0 p 0 = n^2 i combined with the above gives that

n^20 + (N (^) a+ โˆ’ N (^) dโˆ’ )n 0 โˆ’ n^2 i = 0 p^20 + (N (^) dโˆ’ โˆ’ N (^) a+ )p 0 โˆ’ n^2 i = 0

with solutions (omitting the spurious one generated by multiplying through by n 0 (p 0 )), we find

n 0 =

( N (^) dโˆ’ โˆ’ N (^) a+ 2

)

โˆšโˆš โˆšโˆš ( N (^) dโˆ’ โˆ’ N (^) a+ 2

) 2

  • n^2 i

p 0 =

( N (^) a+ โˆ’ N (^) dโˆ’ 2

)

โˆšโˆš โˆšโˆš ( N (^) a+ โˆ’ N (^) dโˆ’ 2

) 2

  • n^2 i

These relations can generally be simplified significantly. For an intrinsic semiconductor, N (^) d+  ni and N (^) aโˆ’  ni and, therefore, n 0 โ‰ˆ ni + (N (^) d+ โˆ’ N (^) aโˆ’ ) and p 0 โ‰ˆ ni โˆ’ (N (^) d+ โˆ’ N (^) aโˆ’ ). For an extrinsic semiconductor, for example, an n-type, ni  N (^) d+ and n 0 โ‰ˆ N (^) d+ with p 0 = n 0 /n^2 i. In our present case, the intrinsic carrier concentration is given by

ni =

โˆš NcNv exp

[ โˆ’ ฮตg 2 kT

] โ‰ˆ 1 ร— 1010 cmโˆ’^3.

  1. (a) If Ec โˆ’ Ef = 0.2eV in GaAs at T = 500โ—ฆK, calculate the values of the equilibrium carrier concentrations, n and p. Solution: The equilibrium carrier concentrations are given by

n = Nc(T = 500โ—ฆC) exp

[ โˆ’

Ec โˆ’ Ef kT |T =500โ—ฆC

] = 9. 05 ร— 1015 cmโˆ’^3.

The band gap of GaAs at room temperature is roughly 1.424 eV. As Ecโˆ’Ef = 0.2eV, then Ef โˆ’ Ev = 1.224eV and we can evaluate

p = Nv exp

[ โˆ’ Ec โˆ’ Ef kT

] = 7. 56 ร— 106 cmโˆ’^3.

(b) Assuming that the value of n you obtained in (a) remains constant, calculate Ec โˆ’ Ef and p at T = 300โ—ฆK. Solution: We have

Ec โˆ’ Ef = โˆ’kT ln

( n Nc

) .

Plugging in

Ec โˆ’ Ef = โˆ’kT ln

( n = 9. 05 ร— 1015 Nc(500โ—ฆC)

) โ‰ˆ 0 .1eV.

The value of Ef โˆ’ Ev should now be circa 1.324 eV. Evaluating

p = Nv exp

( โˆ’

Ef โˆ’ Ev kT

) โ‰ˆ 4. 40 ร— 10 โˆ’^4 cmโˆ’^3.

  1. A certain semiconductor is doped with Nd = 2 ร— 1013 cmโˆ’^3 and NA = 0. The intrinisic carrier concentration for this semiconductor is ni = 2 ร— 1013 cmโˆ’^3.

(a) Determine the majority and minority carrier concentrations at thermal equilibrium. Solution: Here, we have that N (^) d+ โ‰ˆ ni so we must use the general solution for concen- tration in terms of doping to find the effective concentrations. Writing

n 0 =

N (^) d+ โˆ’ N (^) a+ 2

โˆšโˆš โˆšโˆš(^ N + d โˆ’^ N^ a+ 2

) 2

  • n^2 i โ‰ˆ 3 ร— 1013 cmโˆ’^3.

(b) Determine the position of the energy level relative to the intrinsic Fermi level, Ef โˆ’ Ei. Solution: We have that

Ef โˆ’ Ei = kT ln

( n ni

) โ‰ˆ 0 .01eV