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datasheet of bi-directional logic level converter

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October 2005
2005 Fairchild Semiconductor Corporation BSS138 Rev C(W)
BSS138
N-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
These N-Channel enhancement mode field effect
transistors are produced using Fairchild’s proprietary,
high cell density, DMOS technology. These products
have been designed to minimize on-state resistance
while provide rugged, reliable, and fast switching
performance.These products are particularly suited for
low voltage, low current applications such as small
servo motor control, power MOSFET gate drivers, and
other switching applications.
Features
0.22 A, 50 V. R
DS(ON)
= 3.5@ V
GS
= 10 V
R
DS(ON)
= 6.0@ V
GS
= 4.5 V
High density cell design for extremely low R
DS(ON)
Rugged and Reliable
Compact industry standard SOT-23 surface mount
package
G
D
S
SOT-23
D
S
G
Absolute Maximum Ratings T
A
=25
o
C unless otherwise noted
Symbol Parameter Ratings Units
V
DSS
Drain-Source Voltage 50 V
V
GSS
Gate-Source Voltage ±20 V
I
D
Drain Current – Continuous
(Note 1)
0.22 A
Pulsed 0.88
Maximum Power Dissipation
(Note 1)
0.36 W
P
D
Derate Above 25°C 2.8 mW/°C
T
J
, T
STG
Operating and Storage Junction Temperature Range 55 to +150 °C
T
L
Maximum Lead Temperature for Soldering
Purposes, 1/16” from Case for 10 Seconds 300 °C
Thermal Characteristics
R
θJA
Thermal Resistance, Junction-to-Ambient
(Note 1)
350 °C/W
Package Marking and Ordering Information
Device Marking Device Reel Size Tape width Quantity
SS BSS138 7’’ 8mm 3000 units
BSS138
pf3
pf4
pf5

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October 200 5

 2005 Fairchild Semiconductor Corporation BSS138 Rev C(W)

BSS138N-Channel Logic Level Enhancement Mode Field Effect TransistorGeneral Description These N-Channel enhancement mode field effect

transistors are produced using Fairchild’s proprietary,high cell density, DMOS technology. These productshave been designed to minimize on-state resistancewhile provide rugged,performance.These products are particularly suited forlow voltage,servo motor control, power MOSFET gate drivers, and low current applications such as small reliable, and fast switching

other switching applications.

Features • • 0.22 A, 50 V. RHigh density cell design for extremely low RRDS(ON)DS(ON) = 6.0= 3.5ΩΩ @ V@ VGSGS = 10 V= 4.5 V DS(ON)

  • • Rugged and ReliableCompact industry standard SOT-23 surface mountpackage

G

D S

SOT-

D

Absolute Maximum Ratings T A =25 oC unless otherwise noted G S

Symbol VVI D DSS GSS Drain-Source VoltageGate-Source VoltageDrain Current – Continuous– Pulsed Parameter (Note 1) Ratings 0.220.88± 5020 Units VVA

PTT J L D , T STG Maximum Power DissipationDerate Above 25Operating and Storage Junction Temperature RangeMaximum Lead Temperature for SolderingPurposes, 1/16” from Case for 10 Seconds°C (Note 1)^ −55 to +1500.36 300 2.8 mW/°°WCC°C

Thermal Characteristics R Package Marking and Ordering Information θJA Device Marking Thermal Resistance, Junction-to-Ambient Device Reel Size (Note 1) Tape width 350 Quantity °C/W

SS BSS138 7’’ 8mm 3000 units

BSS138 Rev C(W)

Electrical Characteristics SymbolOff Characteristics BV (^) DSS (^) Drain–Source Breakdown Voltage Parameter (^) VT (^) A (^) GS = 25°C unless otherwise noted = 0 V, Test Conditions I (^) D = 250 μA (^) Min 50 Typ Max Units V

∆I DSSBV ∆T DSSJ Breakdown Voltage TemperatureCoefficientZero Gate Voltage Drain Current IVVV D DS DS DS = 250 = 50 V,= 50 V, V= 30 V, μA,Referenced to 25 GS VV= 0 V T GS GS = 0 V= 0 V J = 125 °°CC 72 100 0.5 5 mV/μμnAAA°C

I On Characteristics V ∆ (^) GSS (^) GS(th)V ∆ GS(th)T (^) J Gate–Body Leakage.Gate Threshold VoltageGate Threshold VoltageTemperature Coefficient (Note 2) VVI (^) D (^) GS (^) DS = 1 mA,Referenced to 25 == V ±20 V,GS , VI (^) DS (^) D = 1 mA= 0 V (^) °C 0.8 1.3–2 ±1. (^1005) mV/nAV°C

R Ig D(on)FSDS(on) Static Drain–SourceOn–ResistanceOn–State Drain CurrentForward Transconductance VVVVV GS GS GS GS DS = 10 V,= 4.5 V,= 10 V, I= 10 V,= 10V, D = 0.22 A, TIIVI D D D DS = 0.22 A= 0.22 A= 0.22 A = 5 V J = 125 °C 0.120.2 0.71.01.10.5 3.56.05.8 ΩAS

Dynamic Characteristics CCCRissossrssG Input CapacitanceOutput CapacitanceReverse Transfer CapacitanceGate Resistance Vf = 1.0 MHzV (^) DS (^) GS = 25 V,= 15 mV, (^) f = 1.0 MHzV (^) GS = 0 V, 271369 pFpFpFΩ Switching Characteristics tttt (^) d(on) (^) r (^) d(off)f Turn–On Delay TimeTurn–On Rise TimeTurn–Off Delay TimeTurn–Off Fall Time (^) (Note 2) VV (^) DD (^) GS = 30 V,= 10 V, IR (^) D (^) GEN= 0.29 A, = 6 Ω 2.5 2097 1836145 nsnsnsns QQQ Drain–Source Diode Characteristics and Maximum Ratings I (^) S ggsgd Total Gate ChargeGate–Source ChargeGate–Drain ChargeMaximum Continuous Drain–Source Diode Forward Current (^) VV (^) DS (^) GS = 25 V,= 10 V I (^) D = 0.22 A, 1.70.10.4 (^) 0.222.4 nCnCnCA

Notes: 1. V^ SDRthe drain pins. Rθ^ JA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface ofDrain–Source Diode ForwardVoltageθJC is guaranteed by design while RθCA is determined by the user's board design.V^ GS^ = 0 V,^ I^ S^ = 0.44 A(Note 2)^ 0.8^ 1.4^ V

Scale 1 : 1 on letter size paper 2. Pulse Test: Pulse Widtha) ≤ 350°C/W when mounted on aminimum pad.. 300 μs, Duty Cycle ≤ 2.0%

BSS138 Rev C(W)

Typical Characteristics

024

V^ , GATE-SOURCE VOLTAGE (V)GS 0 0.2 0.4 0.6 Qg , GATE CHARGE (nC) 0.8 1 1.2 1.4 1.6 1.

(^) I (^) D = 220mA VDS = 8V (^) 30V 25V (^20400)

CAPACITANCE (pF) (^0 10) VDS, DRAIN TO SOURCE VOLTAGE (V) 20 30 40 50 C (^) RSSC^ OSS^ CISS f = 1 MHzVGS^ = 0 V Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics. 0.0010.010.

I^ , DRAIN CURRENT (A)D 0.1 VDS , DRAIN-SOURCE VOLTAGE (V) 1 DC 10 100

RSINGLE PULSER (^) DS(ON)θJAVT GS (^) A= 350 = 25 (^) = 10VLIMIToo (^) C (^) C/W 1s100ms10ms1ms^100 μs 012345 P(pk), PEAK TRANSIENT POWER (W) 0.001 0.01 0.1 (^) t 1 , TIME (sec) 1 10 100 1000

(^) SINGLE PULSERθJAT (^) A= 350°C/W = 25°C Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse MaximumPower Dissipation.

0.1^1

r(t), NORMALIZED EFFECTIVE TRANSIENTTHERMAL RESISTANCE 0.0001 0.001 0.01 0.1 t 1 , TIME (sec) 1 10 100 1000

TRRθJAθJA^ (t) = r(t) * R = 350o C/WθJA

0.20.050.10.020.01 SINGLE PULSE P(pk)Duty Cycle, D = tJ - T At 1 = P * Rt 2 θJA 1 (t) / t 2

D = 0.

Figure 11. Transient Thermal Response Curve.Thermal characterization performed using the conditions described in Note 1a.Transient thermal response will change depending on the circuit board design.

DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TOPRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOTARISING OUT OF THECONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT ASSUME ANY LIABILITY ANY

TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and isnot intended to be an exhaustive list of all such trademarks.

LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORTDEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTENAs used herein:1. Life support devices or systems are devices or APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.

systems which, (a) are intended for surgical implant intothe body, or (b) support or sustain life, or (c) whosefailure to perform when properly used in accordancewith instructions for use provided in the labeling, can bereasonably expected to result in significant injury to theuser. 2. A critical component is any component of a lifesupport device or system whose failure to perform canbe reasonably expected to cause the failure of the lifesupport device or system, or to affect its safety oreffectiveness.

PRODUCT STATUS DEFINITIONSDefinition of Terms Advance Information Datasheet Identification Product Status Definition

Preliminary

No Identification NeededObsolete

This datasheet contains the design specifications forproduct development. Specifications may change inany manner without notice.This datasheet contains preliminary data, andsupplementary data will be published at a later date.

Fairchild Semiconductor reserves the right to makechanges at any time without notice in order to improvedesign.This datasheet contains final specifications. FairchildSemiconductor reserves the right to make changes at

any time without notice in order to improve design.This datasheet contains specifications on a productthat has been discontinued by Fairchild semiconductor.The datasheet is printed for reference information only.

Formative orIn DesignFirst Production

Full ProductionNot In Production

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