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rnd ante re a ee hh. ; Hierrear idk gia tied e7¥ beam deflection system: the lasev iS yeflected from bhe back of the arm \evey to the sensitive detector They are Made fyom silicon compounds witha tie vaaias of about ionm. Ss. Force mMeastinvement = The areal wWors Pent depends highly on the force interactions they Contribute to the \mnage Produ¢ed «ihe ferces ave measured toy calculation ef the deflection \evey When the Stiffness of the Icantilevey is Known. LAG calculation is defined by Hookels law, defined as Pollows : force, Kis the stiffness of oes -\wz, whete Fis the dretance the levers bent - the \every and z is the APPLICATIONS oF ATOMIC FORCE _MICROSCO PEE this type of mic toscopy has been use 19 NovionS disciplines lo natural science suchas aoliae state chysics, Semi conducteT studies, molecular engineering ppalyerey chemist ty ,Sutface chemist ty, ia cnedicine and physics: | = mole culay biology, Cel\ birlogy ' Some of these appl cations vndude : \. saenks fying atoms om damples: 2, Evalucting Sortce ‘interactions between atoms: 3. Studying the dhysical changing eropetlies of atoms: he Studying the structural and ea _ of Protein Complexes and assembly, Such as mictotubules. 
