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3. the Atomic Fotce microscope (arm) takes the ines of the surface topography ofthe sample y rere by Scanning the cantilever over o Section of interest - Depending on how raised o¥ how low the surface of the samele is, it determines the deflection of the ane! whaich.is monitored by the Positive -sensitive Bane a | CesoP).the microscope hos 0 feedback \ooe ee controls the length ef the cantilever tie just abeve the sample surface, therefore it Will Maintain the laser Position thus papas an accurate neal) Oatate of the oe the ees PARTS OF ATomMiIc FoRCE MICROSCOPE . Atomic Force mictoscopes have several techniques Soy measuring force interactions such as var dev Waals, thermal, electrical and magnetic force hateractions fer these Wtevactions done by the Arm, it has the following parts that assist in controlling ats functions. L Modified hes wich ate used to elective same deflections: s used to image the sample s. 3. Fecdloack leer controi- they corttelthe ferce interactions laser Aeflectorv The lase¥ and the tie positions using cae eSleche Rrennenas ack of the cantileveY and the Lie : 1 nth the sutface of the lank ‘ube theuale jateracts 5 indy Lion on the Proto detector WG Samele, the laser's Pee , 0 fF urttrace o used \n-Hedaumgemipmemmtese tov aekg ON nt Ree ay. the samele and measurement: surface and undergo 2 soft ware adjustment 
