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Those are lecture notes for the semiconductor device subject. It is helpful for the second student.
Typology: Lecture notes
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Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 5-
SiO (^2)
metal
gate
Vg
gate
Vg
SiO (^2) N+
N
+^ polysilicon
SiO
2
P-Silicon body
5.2 Surface Accumulation
3.1eV
Ec , Ef
Ev E 0
Ec
Ef Ev
M O S
qVg
Vox
q^ f s
Make Vg < Vfb
is negligible when the surface is in accumulation.
f (^) s : surface potential, band bending Vox : voltage across the oxide
5.2 Surface Accumulation
Gauss’s Law
V g < V t
5.3 Surface Depletion
This equation can be solved to yield f s.
5.4 Threshold Condition and Threshold Voltage
Threshold (of inversion):
n (^) s = Na , or
( Ec–Ef ) (^) surface= ( Ef – Ev ) (^) bulk , or
A=B, and C = D (^) E
M O S
B
C = q^ fB
f st
Threshold Voltage