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A homework assignment for the digital electronics course (ece 4500/5950) in spring 2009. Students are required to calculate the worst-case tplh and tphl for a 3-input nand gate using analytical methods and verify the results through simulation using design architect, eldo, and xelga. The document also provides the necessary device sizes, cl value, and vdd for the gate.
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Homework Assignment # Total: 64 pts. Due 9:30am, Wednesday, February 4, 2009
Consider the 0.25-micron complementary static CMOS technology used in the Lab for a 3-input NAND gate with device sizes as follows: PMOS W=4.0μm , L=1.2μm and NMOS W=2.0μm , L=1.2μm , respectively. Assume that CL = 7fF and VDD = 2.5V. Work with the parameters given in Table 3-2 on Page 103 of the Text.
Tasks: a) Obtain analytically the worst-case tPLH and tPHL.. Work with the formulas given on Page 200 of the Text (5.17, 5.18 and 5.19). You can obtain the λ values from Table 3-2. (24 pts.)
b) Verify your results in Part a) by modeling and simulating the 3-input NAND gate above using Design Architect along with ELDO and Xelga. You need to add CL to your schematics. Turn in a hard copy of your circuit schematic diagram and commented simulation printouts showing tPLH and tPHL , respectively. Compare your simulation results with the calculated ones in Part a). (40 pts.)